IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Self-reference Image Decomposition Algorithm for Strip Steel Surface Defect Detection

Author(s): Kun Liu ; Nana Luo ; Aimei Li ; Ying Tian ; Hasan Sajid ; Haiyong Chen
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2952706
Regular:

low contrast between the defect and the background, and so on. Image-decomposition-based method can analyze the structure and Automatic vision-based defect detection on the steel surface is... View More

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