IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Deep Learning Network via Shunt-wound Restricted Boltzmann Machines Using Raw Data for Fault Detection

Author(s): Tongyang Pan ; Jinglong Chen ; Jun Pan ; Zitong Zhou
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2019.2953436
Regular:

Intelligent fault detection has been widely used for feature extraction and fault classification. However, various complex signal processing methods are adopted in many researches. The paper... View More

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