IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sequential shift absolute phase aberration calibration in digital holographic phase imaging based on Chebyshev polynomials fitting

Author(s): Weilin He ; Jiantai Dou ; Zhongming Yang ; Zhenhua Liu ; Zhaojun Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 1943-0647
ISSN (Electronic): 1943-0655
DOI: 10.1109/JPHOT.2019.2953198
Regular:

We propose a novel absolute calibrate method for digital holographic microscopy with the sequential shift method using Chebyshev polynomials. We separate the object phase and the aberrations by... View More

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