IEEE - Institute of Electrical and Electronics Engineers, Inc. - RETROFIT: Fault-Aware Wear Leveling

Author(s): Jiangwei Zhang ; Donald Kline ; Liang Fang ; Rami Melhem ; Alex K. Jones
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2018
Volume: 17
Page(s): 167 - 170
ISSN (CD): 2473-2575
ISSN (Electronic): 1556-6064
ISSN (Paper): 1556-6056
DOI: 10.1109/LCA.2018.2840137
Regular:

Phase-change memory (PCM) and resistive memory (RRAM) are promising alternatives to traditional memory technologies. However, both PCM and RRAM suffer from limited write endurance and due to... View More

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