IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Availability of Multicore Real-Time Systems Suffering Both Permanent and Transient Faults

Author(s): Junlong Zhou ; Xiaobo Sharon Hu ; Yue Ma ; Jin Sun ; Tongquan Wei ; Shiyan Hu
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2019
Volume: 68
Page(s): 1,785 - 1,801
ISSN (CD): 2326-3814
ISSN (Electronic): 1557-9956
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2019.2935042
Regular:

CMOS scaling has greatly increased concerns for both lifetime reliability due to permanent faults and soft-error reliability due to transient faults. Most existing works only focus on one of the... View More

Advertisement