IEEE - Institute of Electrical and Electronics Engineers, Inc. - PaRS: A Popularity-Aware Redundancy Scheme for In-Memory Stores

Author(s): Panping Zhou ; Jianzhong Huang ; Xiao Qin ; Changsheng Xie
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Distributed Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2019
Volume: 68
Page(s): 556 - 569
ISSN (CD): 2326-3814
ISSN (Electronic): 1557-9956
ISSN (Paper): 0018-9340
DOI: 10.1109/TC.2018.2876827
Regular:

In-memory store has become a key component for an increasing number of data-intensive applications like OLTP and OLAP. To be resilient to data loss incurred by transient failures, redundancy... View More

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