IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experiments and Comparisons of Power to Failure for SiGe-Based Low-Noise Amplifiers Under High-Power Microwave Pulses

Author(s): Liang Zhou ; Xiang Chen ; Hong-Li Peng ; Wen-Yan Yin ; Jun-Fa Mao
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2018
Volume: 60
Page(s): 1,427 - 1,435
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2017.2771252
Regular:

This study demonstrates comparisons of power to failure for SiGe-based low-noise amplifiers by injecting high-power microwave pulses. A general equation was derived to calculate power to failure,... View More

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