IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistics of the Current Induced Within a Partially Shielded Enclosure in a Reverberation Chamber

Author(s): James C. West ; Rahul Bakore ; Charles F. Bunting
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2017
Volume: 59
Page(s): 2,014 - 2,022
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2017.2693119
Regular:

The statistics of the current induced on conducting wires and surfaces within a partially shielded enclosure by aperture coupling of an ideally random, mechanically stirred reverberation chamber... View More

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