IEEE - Institute of Electrical and Electronics Engineers, Inc. - Development of a Novel Linear ERT Sensor to Measure Surface Deposits

Author(s): Zhen Ren ; Linda Trinh ; Michael Cooke ; Sergio Carrillo De Hert ; Jessica Silvaluengo ; Jon Ashley ; Ibtisam E. Tothill ; Thomas L. Rodgers
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2019
Volume: 68
Page(s): 754 - 761
ISSN (Electronic): 1557-9662
ISSN (Paper): 0018-9456
DOI: 10.1109/TIM.2018.2853380
Regular:

This paper investigates the feasibility of using electrical resistance tomography (ERT) to visualize the surface deposit during a cleaning-in-place (CIP) process, which is a common problem in... View More

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