IEEE - Institute of Electrical and Electronics Engineers, Inc. - Degradation Modeling and Lifetime Prediction Considering Effective Shocks in a Dynamic Environment

Author(s): Tingting Huang ; Bo Peng ; David W. Coit ; Zixuan Yu
Sponsor(s): IEEE Reliability Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2019
Volume: 68
Page(s): 819 - 830
ISSN (Electronic): 1558-1721
ISSN (Paper): 0018-9529
DOI: 10.1109/TR.2019.2917058
Regular:

For some design applications, the environment in actual field conditions does not remain constant but instead changes dynamically. In addition, stress levels might change sharply, and if the... View More

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