IEEE - Institute of Electrical and Electronics Engineers, Inc. - Source Density Apodisation: Image Artefact Suppression through Source Pitch Non-Uniformity

Author(s): Erwin J. Alles ; Adrien E. Desjardins
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1525-8955
ISSN (Paper): 0885-3010
DOI: 10.1109/TUFFC.2019.2945636
Regular:

Conventional ultrasound imaging probes typically comprise finite-sized arrays of periodically spaced transducer elements, which in the case of phased arrays can result in severe grating and side... View More

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