IEEE - Institute of Electrical and Electronics Engineers, Inc. - Autonomous Scan Patterns for Laser Voltage Imaging

Author(s): Jerzy Tyszer ; Wu-Tung Cheng ; Sylwester Milewski ; Grzegorz Mrugalski ; Janusz Rajski ; Maciej Trawka
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2376-4562
ISSN (Electronic): 2168-6750
DOI: 10.1109/TETC.2019.2944590
Regular:

The semiconductor industry ramping up design capabilities for emerging technologies is facing new test quality and yield management challenges. To facilitate debugging of the first silicon,... View More

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