IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deep Learning based Small Surface Defect Detection via Exaggerated Local Variation-based Generative Adversarial Network

Author(s): Jian Lian ; Weikuan Jia ; Masoumeh Zareapoor ; Yuanjie Zheng ; Rong Luo ; Deepak Kumar Jain ; Neeraj Kumar
Sponsor(s): IEEE Industrial Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0050
ISSN (Paper): 1551-3203
DOI: 10.1109/TII.2019.2945403
Regular:

Surface detection of small defects plays a vital role in manufacturing and has attracted broad interest. It remains challenging primarily due to the small size of the defect relative to the large... View More

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