IEEE - Institute of Electrical and Electronics Engineers, Inc. - Wavelet-Multi Resolution Analysis Based ANN Architecture for Fault Detection and Localization in DC Microgrids

Author(s): D.K.J.S Jayamaha ; N.W.A Lidula ; A.D Rajapakse
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2945397
Regular:

DC microgrids present an effective power system solution for increased integration of renewable sources while providing clear benefits, such as high efficiency and simpler control. However, the... View More

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