IEEE - Institute of Electrical and Electronics Engineers, Inc. - Selection of Primary Output Vectors to Observe Under Multicycle Tests

Author(s): Irith Pomeranz
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 7
ISSN (Electronic): 1557-9999
ISSN (Paper): 1063-8210
DOI: 10.1109/TVLSI.2019.2941883
Regular:

Test compaction benefits from the use of multicycle tests that have several clock cycles between their scan-in and scan-out operations. For maximum benefit, primary output vectors should be... View More

Advertisement