IEEE - Institute of Electrical and Electronics Engineers, Inc. - Data-Driven Vulnerability Exploration for Design Phase System Analysis

Author(s): Georgios Bakirtzis ; Brandon J. Simon ; Aidan G. Collins ; Cody Harrison Fleming ; Carl R. Elks
Sponsor(s): IEEE Systems Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (CD): 2373-7816
ISSN (Electronic): 1937-9234
ISSN (Paper): 1932-8184
DOI: 10.1109/JSYST.2019.2940145
Regular:

Applying security as a lifecycle practice is becoming increasingly important to combat targeted attacks in safety-critical systems. Among others, there are two significant challenges in this area:... View More

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