IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metric Learning for Patch-Based 3-D Image Registration

Author(s): ShaoPeng Li ; Tao Zhang ; Daqiao Zhang ; Yongfang Nie ; Jiping Wang
Sponsor(s): IEEE Robotics and Automation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2019
Volume: 16
Page(s): 1,575 - 1,583
ISSN (Electronic): 1558-3783
ISSN (Paper): 1545-5955
DOI: 10.1109/TASE.2019.2890866
Regular:

Patch-based image registration is a challenging problem in visual geometry, the crucial component of which is the selection of an appropriate similarity measure. The similarity measure... View More

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