IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fast and Robust Nonparametric Monitoring Scheme for Free-Form Surface Scanning Data

Author(s): Kai Wang ; Fugee Tsung
Sponsor(s): IEEE Robotics and Automation Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2019
Volume: 16
Page(s): 1,675 - 1,685
ISSN (Electronic): 1558-3783
ISSN (Paper): 1545-5955
DOI: 10.1109/TASE.2019.2892510
Regular:

The advance of new sensing technologies, such as the 3-D laser scanning, creates a data-rich environment for quality control in modern industries. The free-form surfaces of complex manufactured... View More

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