IEEE - Institute of Electrical and Electronics Engineers, Inc. - Layout-Aware Variability Analysis, Yield Prediction, and Optimization in Photonic Integrated Circuits

Author(s): Wim Bogaerts ; Yufei Xing ; Umar Khan
Sponsor(s): IEEE Lasers and Electro-Optics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2019
Volume: 25
Page(s): 1 - 13
ISSN (Electronic): 1558-4542
ISSN (Paper): 1077-260X
DOI: 10.1109/JSTQE.2019.2906271
Regular:

We present a simulation framework for evaluating the effect of location-dependent variability in photonic integrated circuits. The framework combines a fast circuit simulator with circuit layout... View More

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