IEEE - Institute of Electrical and Electronics Engineers, Inc. - Physical Unclonable Functions for On-Chip Instrumentation: Enhancing the Security of the Internal Joint Test Action Group Network

Author(s): Sudeendra K. Kumar ; Naini Satheesh ; Abhishek Mahapatra ; Sauvagya Sahoo ; K.K. Mahapatra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2019
Volume: 8
Page(s): 62 - 66
ISSN (Electronic): 2162-2256
ISSN (Paper): 2162-2248
DOI: 10.1109/MCE.2019.2905539
Regular:

The number of on-chip instruments, which are omnipresent in consumer electronics (CE) devices and used to monitor chips? performance, is increasing. The IEEE P1687 standard is used to streamline... View More

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