IEEE - Institute of Electrical and Electronics Engineers, Inc. - ACME: A Tool to Improve Configuration Memory Fault Injection in SRAM-Based FPGAs

Author(s): Luis Alberto Aranda ; Alfonso Sanchez-Macian ; Juan Antonio Maestro
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 128,153 - 128,161
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2939858
Regular:

Circuits in harsh environments, as space, tend to suffer severe problems caused by radiation. In this scenario, where the behavior of the system can be jeopardized, it is critical to produce fault... View More

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