IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compressed Blind Deconvolution and Denoising for Complementary Beam Subtraction Light-Sheet Fluorescence Microscopy

Author(s): Chen Bai ; Chao Liu ; Hao Jia ; Tong Peng ; Junwei Min ; Ming Lei ; Xianghua Yu ; Baoli Yao
Sponsor(s): IEEE Engineering In Medicine and Biology Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2019
Volume: 66
Page(s): 2,979 - 2,989
ISSN (Electronic): 1558-2531
ISSN (Paper): 0018-9294
DOI: 10.1109/TBME.2019.2899583
Regular:

Objective: The side-lobes of a Bessel beam (BB) create a severe out-of-focus background in scanning light-sheet fluorescence microscopy, thereby extremely limiting the axial resolution. The... View More

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