IEEE - Institute of Electrical and Electronics Engineers, Inc. - Secondary Arc and Critical Time of Fault Clearance in Overhead Lines

Author(s): R. M. Arias Velasquez ; J. V. Mejia Lara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2018
Volume: 16
Page(s): 859 - 868
ISSN (Electronic): 1548-0992
DOI: 10.1109/TLA.2018.8358666
Regular:

This research presents a methodology for the creation of a novel computational algorithm, which allowed the automation of the simulation activities associated to the determination of critical... View More

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