IEEE - Institute of Electrical and Electronics Engineers, Inc. - GMM clustering Based Decision Trees Considering Fault Rate and Cluster Validity for Analog Circuit Fault Diagnosis

Author(s): Junyou Shi ; Qingjie He ; Zili Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2943380
Regular:

Traditional decision trees for fault diagnosis often use an ID3 construction algorithm. For promoting the accuracy and efficiency of decision trees, considering the cluster validity and fault... View More

Advertisement