IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting At-Risk Students with Early Interventions Using Machine Learning Techniques

Author(s): Raghad Al-Shabandar ; Abir Jaafar Hussain ; Panos Liatsis ; Robert Keight
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2943351
Regular:

Massive Open Online Courses (MOOCs) have shown rapid development in recent years, allowing learners to access high-quality digital material. Because of facilitated learning and the flexibility of... View More

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