IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predictive Mutation Testing

Author(s): Jie Zhang ; Lingming Zhang ; Mark Harman ; Dan Hao ; Yue Jia ; Lu Zhang
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2019
Volume: 45
Page(s): 898 - 918
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2018.2809496
Regular:

Test suites play a key role in ensuring software quality. A good test suite may detect more faults than a poor-quality one. Mutation testing is a powerful methodology for evaluating the... View More

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