IEEE - Institute of Electrical and Electronics Engineers, Inc. - Passive Intermodulation Source Localization Based on Emission Source Microscopy

Author(s): Shaohui Yong ; Sen Yang ; Ling Zhang ; Xiong Chen ; David J. Pommerenke ; Victor Khilkevich
Sponsor(s): IEEE Electromagnetic Compatibility Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 6
ISSN (Electronic): 1558-187X
ISSN (Paper): 0018-9375
DOI: 10.1109/TEMC.2019.2938634
Regular:

Emission source microscopy (ESM) technique can be used for localization and characterization of electromagnetic interference sources by measuring the magnitude and phase of the electromagnetic... View More

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