IEEE - Institute of Electrical and Electronics Engineers, Inc. - Facts and Myths of Dielectric Breakdown Processes--Part I: Statistics, Experimental, and Physical Acceleration Models

Author(s): Ernest Y. Wu
Sponsor(s): IEEE Electron Devices Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 12
ISSN (Electronic): 1557-9646
ISSN (Paper): 0018-9383
DOI: 10.1109/TED.2019.2933612
Regular:

In part I of this article, the current understanding and experimental observations of the so-called first breakdown (BD) phenomena are reviewed and summarized with a focus on BD statistics and... View More

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