IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Model for Failure Mode and Effects Analysis Based on k-Means Clustering Within Hesitant Linguistic Environment

Author(s): Chun-Yan Duan ; Xu-Qi Chen ; Hua Shi ; Hu-Chen Liu
Sponsor(s): IEEE Technology Management Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 11
ISSN (Electronic): 1558-0040
ISSN (Paper): 0018-9391
DOI: 10.1109/TEM.2019.2937579
Regular:

Failure mode and effects analysis (FMEA) is a systematic and proactive risk prevention and management tool used to improve the reliability and safety of a system, process or service. However, many... View More

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