IEEE - Institute of Electrical and Electronics Engineers, Inc. - Studying the Impact of Noises in Build Breakage Data

Author(s): Taher Ahmed Ghaleb ; Daniel Alencar da Costa ; Ying Zou ; Ahmed E. Hassan
Sponsor(s): IEEE Comput. Soc. Tech. Council on Software Eng.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2326-3881
ISSN (Electronic): 1939-3520
ISSN (Paper): 0098-5589
DOI: 10.1109/TSE.2019.2941880
Regular:

Much research has investigated the common reasons for build breakages. However, prior research has paid little attention to builds that may break due to reasons that are unlikely to be related to... View More

Advertisement