IEEE - Institute of Electrical and Electronics Engineers, Inc. - Learning Discriminative Embedding for Hyperspectral Image Clustering Based on Set-to-Set and Sample-to-Sample Distances

Author(s): Yao Qin ; Lorenzo Bruzzone ; Biao Li
Sponsor(s): IEEE Geoscience and Remote Sensing Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 13
ISSN (Electronic): 1558-0644
ISSN (Paper): 0196-2892
DOI: 10.1109/TGRS.2019.2937204
Regular:

Recently, deep learning techniques have been introduced to address hyperspectral image (HSI) classification problems and have achieved the state-of-the-art performances. In this article, we... View More

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