IEEE - Institute of Electrical and Electronics Engineers, Inc. - ScanSAT: Unlocking Static and Dynamic Scan Obfuscation

Author(s): Lilas Alrahis ; Muhammad Yasin ; Nimisha Limaye ; Hani Saleh ; Baker Mohammad ; Mahmoud Alqutayri ; Ozgur Sinanoglu
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (CD): 2376-4562
ISSN (Electronic): 2168-6750
DOI: 10.1109/TETC.2019.2940750
Regular:

While financially advantageous, outsourcing key steps, such as testing, to potentially untrusted Outsourced Assembly and Test (OSAT) companies may pose a risk of compromising on-chip assets.... View More

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