IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Fast and Robust Diagnostic Method for Multiple Open-circuit Faults of Voltage-Source Inverters through Line Voltage Magnitudes Analysis

Author(s): Xun Wu ; Chun-Yang Chen ; Te-Fang Chen ; Shu Cheng ; Zhi-Hong Mao ; Tian-Jian Yu ; Kaidi Li
Sponsor(s): IEEE Power Electronics Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1941-0107
ISSN (Paper): 0885-8993
DOI: 10.1109/TPEL.2019.2941480
Regular:

In this paper, a fast and robust diagnostic method for multiple open-circuit (OC) faults is presented for voltage-source inverters. Only two line voltages are used as diagnosis variables, which is... View More

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