IEEE - Institute of Electrical and Electronics Engineers, Inc. - Maximal Uncorrelated Multinomial Logistic Regression

Author(s): Dajiang Lei ; Hongyu Zhang ; Hongtao Liu ; Zhixing Li ; Yu Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2019
Volume: 7
Page(s): 89,924 - 89,935
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2921820
Regular:

Multinomial logistic regression (MLR) has been widely used in the field of face recognition, text classification, and so on. However, the standard multinomial logistic regression has not yet... View More

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