IEEE - Institute of Electrical and Electronics Engineers, Inc. - Efficient Colorful Fourier Ptychographic Microscopy Reconstruction With Wavelet Fusion

Author(s): Jizhou Zhang ; Tingfa Xu ; Sining Chen ; Xing Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2018
Volume: 6
Page(s): 31,729 - 31,739
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2018.2841854
Regular:

Fourier ptychographic microscopy (FPM) is a recently developed microscope that offers wide field, high resolution, and quantitative phase imaging. Combining the concepts of ptychography, synthetic... View More

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