IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the Design of Multi-Edge Type Low-Density Parity-Check Codes

Author(s): Suhwang Jeong ; Jeongseok Ha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 1558-0857
ISSN (Paper): 0090-6778
DOI: 10.1109/TCOMM.2019.2927567
Regular:

Since multi-edge type low-density parity-check (MET-LDPC) codes were first proposed, design of MET-LDPC codes has been extensively studied for various applications. However, the existing design... View More

Advertisement