IEEE - Institute of Electrical and Electronics Engineers, Inc. - Spacecraft Worst Case Surface Charging: On the Importance of Measuring the Electron Emission Yield Under Representative Environmental Conditions

Author(s): J.-C. Mateo-Velez ; M. Belhaj ; S. Dadouch ; P. Sarrailh ; S. L. G. Hess ; D. Payan
Sponsor(s): IEEE Nuclear and Plasma Sciences Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 6
ISSN (Electronic): 1939-9375
ISSN (Paper): 0093-3813
DOI: 10.1109/TPS.2019.2925435
Regular:

To represent the time spent by space materials on ground before launch, the measurement of secondary electron emission properties is performed after long duration exposure to ambient atmosphere... View More

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