IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault Detection, Classification, and Location by Static Switch in Microgrids Using Wavelet Transform and Taguchi-Based Artificial Neural Network

Author(s): Ying-Yi Hong ; Mark Tristan Angelo M. Cabatac
Sponsor(s): IEEE Systems Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 11
ISSN (CD): 2373-7816
ISSN (Electronic): 1937-9234
ISSN (Paper): 1932-8184
DOI: 10.1109/JSYST.2019.2925594
Regular:

Microgrids, which are small electric power systems, accommodate different distributed generations and energy storage system. When faults occur outside or inside a microgrid, the static switch... View More

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