IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel TLM Analysis for Solar Cells

Author(s): Hanan Mir ; Varun Arya ; Hannes Hoffler ; Andreas Brand
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 7
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2923337
Regular:

Despite its widespread usage, the linear regression method used to obtain contact resistivity and sheet resistance from the transmission line model (TLM) can lead to huge errors. The method... View More

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