IEEE - Institute of Electrical and Electronics Engineers, Inc. - Precise Extraction of Dynamic Rdson under High Frequency and High Voltage by A Double-Diode-Isolation Method

Author(s): Jianming Lei ; Rui Wang ; Guo Yang ; Jin Wang ; Fulong Jiang ; Dunjun Chen ; Hai Lu ; Rong Zhang ; Youdou Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2168-6734
DOI: 10.1109/JEDS.2019.2927608
Regular:

A double-diode-isolation method with low parasitic capacitance devices and reverse clamping is proposed to accurately extract the high-frequency and high-voltage dynamic on-resistance... View More

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