IEEE - Institute of Electrical and Electronics Engineers, Inc. - Predicting Software Defects Using Self-Organizing Data Mining

Author(s): Jun-hua REN ; Feng LIU
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2927489
Regular:

The study predicts the software defect of ranking and classification by utilizing the selforganizing data mining method. The causal relation between software metrics and defects in software... View More

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