IEEE - Institute of Electrical and Electronics Engineers, Inc. - Microscopic Machine Vision Based Degradation Monitoring of Low-voltage Electromagnetic Coil Insulation Using Ensemble Learning in a Membrane Computing Framework

Author(s): Chen Li ; Fanjie Kong ; Kai Wang ; Aidong Xu ; Gexiang Zhang ; Ning Xu ; Zhihua Liu ; Haifeng Guo ; Xue Wang ; Kuan Liang ; Jianying Yuan ; Shouliang Qi ; Tao Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1
ISSN (Electronic): 2169-3536
DOI: 10.1109/ACCESS.2019.2928025
Regular:

In this paper, a novel microscopic machine vision system is proposed to solve a degradation monitoring problem of low-voltage electromagnetic coil insulation in practical industrial fields, where... View More

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