IEEE - Institute of Electrical and Electronics Engineers, Inc. - Match and Mismatch [MicroBusiness]

Author(s): Fred Schindler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2019
Volume: 20
Page(s): 14 - 15
ISSN (Electronic): 1557-9581
ISSN (Paper): 1527-3342
DOI: 10.1109/MMM.2019.2915465
Regular:

Microwave engineers are used to worrying about match and mismatch. We have ways to characterize it: VSWR and return loss. We even have the Smith chart so we can visualize it and design for it.... View More

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