IEEE - Institute of Electrical and Electronics Engineers, Inc. - An Extensive Survey on Satellite Image Enhancement

2018 International Conference on Smart Systems and Inventive Technology (ICSSIT)

Author(s): A. Alphonse John Kenneth ; F. Ramesh Dhanaseelan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Tirunelveli, India, India
Conference Date: 13 December 2018
Page(s): 425 - 429
ISBN (Electronic): 978-1-5386-5873-4
ISBN (DVD): 978-1-5386-5872-7
DOI: 10.1109/ICSSIT.2018.8748631
Regular:

Usually Images are corrupted by many decays comprising blurring, low contrast, high brightest or noise. Thus, it is essential to filter these images before starting the diagnostic process. Now a... View More

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