IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of Measurement Temperature on Interfacial Charge Freed from Deep Traps Located at the Interface of Oil-Paper Insulation

2018 IEEE Applied Signal Processing Conference (ASPCON)

Author(s): D. Dey ; A. Sarkar ; S. Pal ; A. Kumar ; D. Mishra ; A. Baral ; N. Haque ; S. Chakravorti
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 2018
Conference Location: Kolkata, India, India
Conference Date: 7 December 2018
Page(s): 346 - 350
ISBN (Electronic): 978-1-5386-6686-9
DOI: 10.1109/ASPCON.2018.8748278
Regular:

Accumulation of interfacial charge creates local field distortion during insulation response measurement. Furthermore, such localized field enhancement affects the interaction between polar... View More

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