IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cascading Failure of Cyber-Coupled Power Systems Considering Interactions Between Attack and Defense

Author(s): Dong Liu ; Chi K. Tse
Sponsor(s): IEEE Circuits and Systems Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 14
ISSN (Electronic): 1558-0806
ISSN (Paper): 1549-8328
DOI: 10.1109/TCSI.2019.2922371
Regular:

In this paper, we develop a network-based model with consideration of the physical power flow process to study the cascading failure in cyber-coupled power systems. We take the coupling between... View More

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