IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic Built-In Redundancy Analysis for Memory Repair

Author(s): Hayoung Lee ; Donghyun Han ; Seungtaek Lee ; Sungho Kang
Sponsor(s): IEEE Computer Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Volume: PP
Page(s): 1 - 10
ISSN (Electronic): 1557-9999
ISSN (Paper): 1063-8210
DOI: 10.1109/TVLSI.2019.2920999
Regular:

As advances in memory density and capacity result in an increase in the probability of fault occurrence, many studies on built-in redundancy analysis (BIRA) have been conducted to address this... View More

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