IEEE - Institute of Electrical and Electronics Engineers, Inc. - Transmission Line Image Defect Diagnosis Preprocessed Parallel Method Based on Deep Learning

2018 3rd International Conference on Mechanical, Control and Computer Engineering (ICMCCE)

Author(s): Bing Tian ; Dong Li ; Wei Wang ; Yin Liu ; Qi Lin Yin ; Guang Xiu Liu ; Wan Guo Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2018
Conference Location: Huhhot, China
Conference Date: 14 September 2018
Page(s): 299 - 303
ISBN (Electronic): 978-1-5386-8481-8
DOI: 10.1109/ICMCCE.2018.00068
Regular:

Deep learning has shown its potential and advantages in feature extraction and model fitting. It has also been promoted and applied in the field of transmission, and cooperates with drone... View More

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