IEEE - Institute of Electrical and Electronics Engineers, Inc. - Early Detection of Potential Induced Degradation by Measurement of the Forward DC Resistance in Crystalline PV Cells

Author(s): Michalis Florides ; George Makrides ; George E. Georghiou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2019
Volume: 9
Page(s): 942 - 950
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2910235
Regular:

Potential induced degradation (PID) is still a serious threat for the photovoltaic (PV) industry and it is expected to aggravate due to the tendency to increase the operating voltage of PV... View More

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