IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of an Imaging System for Characterizing Microcracks in Crystalline Silicon Solar Cells Using Light Transflection

Author(s): Teow Wee Teo ; Zeinab Mahdavipour ; Mohd Zaid Abdullah
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2019
Volume: 9
Page(s): 1,097 - 1,104
ISSN (Electronic): 2156-3403
ISSN (Paper): 2156-3381
DOI: 10.1109/JPHOTOV.2019.2915586
Regular:

One major problem encountered during the manufacture of crystalline silicon solar cells is microcrack. State-of-the-art system that uses the photoluminescence technique for microcrack detection... View More

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